| UV-Vis EDUCATIONAL ONLINE SEMINAR LIBRARY |
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Choosing the right accessory for your UV/Vis/NIR reflectance measurements
Description: Learn how to select the right tool for the job. Measuring reflectance and the spectrophotometry accessories currently available for the PerkinElmer LAMBDA 650/850/950 series will be discussed. Examples will be given for: Specular and diffuse samples; Measuring at near-normal and oblique incidence; and Extremely large and microscopically small samples, from AR coatings to laser mirrors and variable angle spectrophotometry for thin film analysis |
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Making the most accurate measurements of UV/Vis/NIR transmittance and reflectance
Description: Using optimum measurement conditions and the most appropriate accessory, very high accuracy spectrophotometry is possible using a modern, industry-leading commercial instrument like the PerkinElmer LAMBDA 950. |
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Ensuring Optimal Performance on Your UVVis
Description: This presentation describes various tips and techniques for obtaining and maintaining optimal performance on your UV/Vis or UV/Vis/NIR system. This includes information on instrument validation, sample handling tips and advice on the use of accessories. |
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Breakthrough in Specular Reflectance Measurement: The New Universal Reflectance Accessory (URA)
Description: We present a breakthrough sampling accessory, the Universal Reflectance Accessory (URA), which simplifies variable-angle specular reflectance measurements on a wide variety of samples. The webcast discusses how the URA design enables automatic, reproducible angle-chaniging with no adjustments to the sample or the accessory optics, reducing measurement time and increasing productivity. Using real-world examples, we discuss the use of the URA for a variety of absolute and relative specular reflectance measurements. |
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Polarization and Depolarization in UV/Vis/NIR Analysis
Description: This presentation covers key aspects of the use of depolarization and polarization in UV/Vis/NIR measurements on a variety of samples. The theory of polarized light and polarizing materials is briefly discussed along with a consideration of polarization effects on samples. Practical techniques to correct and control the effects of instrument polarization are presented using illustrative examples. |
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Specular Reflectance Measurement: Choosing Relative or Absolute Reflectance Techniques
Description: This presentation overviews aspects of specular reflectance measurements, including basic optical principles, the choice between relative and absolute measurements and tips and techniques to improve the quality of your analyses. Advice on the choice of accessories is provided, with examples of the advantages and disadvantages of common designs. Techniques for measurements on a variety of thin-films are discussed, including the use of polarizers and beam attenuation. |
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Raising the Performance Standard in UV/Vis/NIR and UV/Vis Spectrophotometry: The New Lambda 950/850/650
Description: This webcast overviews PerkinElmer's new range of high-performance UV/Vis and UV/Vis/NIR Spectrophotometers. The system design allows virtually any sample type to be easily accommodated in the huge dual sample compartments. We describe how a new range of modular accessories simplifies measurement for a wide variety of samples, increasing your productivity. Example data is shown and a variety of potential sampling configurations are explained. |
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Diffuse Reflectance Techniques in UV/Vis/NIR Analysis
Description: A variety of UV/Vis and UV/Vis/NIR applications using integrating spheres are discussed. These include specular, diffuse and total reflectance application and transmittance measurements on solid materials. Example results are also presented. The webcast also describes the use of integrating spheres to correct for common sources of sampling error. Also, advice is given on choosing the most appropriate integrating sphere for your application.
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