Description: This presentation overviews aspects of specular reflectance measurements, including basic optical principles, the choice between relative and absolute measurements and tips and techniques to improve the quality of your analyses. Advice on the choice of accessories is provided, with examples of the advantages and disadvantages of common designs. Techniques for measurements on a variety of thin-films are discussed, including the use of polarizers and beam attenuation.
Presenter: William Sweet is a Senior Product Specialist with 16 years of experience in customer support and training for UV/VIS/NIR and Fluorescence spectroscopy applications. He works closely with PerkinElmer development teams to provide field input for new products.
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