• Choosing the right accessory for your UV/Vis/NIR reflectance measurements

Learn how to select the right tool for the job. Measuring reflectance and the spectrophotometry accessories currently available for the PerkinElmer LAMBDA 650/850/950 series will be discussed. Examples will be given for:

  • Specular and diffuse samples
  • Measuring at near-normal and oblique incidence
  • Extremely large and microscopically small samples, from AR coatings to laser mirrors and variable angle spectrophotometry for thin film analysis

Presenter: Dr. Peter A. van Nijnatten is the program manager of the Optical Measurements and Testing department at TNO Science and Industry, the Dutch organization for applied scientific research. He received his MSc degree in physics from the University of Delft (Netherlands) and his PhD from the Oxford Brookes University (UK). Dr. Nijnatten has been at TNO for the last 20 years of his 25-year involvement with metrology, and is responsible for the technical and scientific content of over 250 projects. He is vice chairman of the technical experts committee, TC10 "Optical Properties", of the International Commission on Glass, and is the founder and leader of OMT, the Optical Measurements and Testing group at TNO. OMT's mission is to provide the industry with state-of-the-art solutions for optical measurements and testing. It has developed and produced some of the unique spectrophotometer accessories that are currently available for the PerkinElmer LAMBDA Series. In addition, Dr. Nijnatten and his group provide customized measurement solutions and training to PerkinElmer customers.

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