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Description: This online seminar identifies current potential areas where the productivity of FT-IR analyses can be improved. Several recent new technology developments are discussed and the benefits to sample throughput demonstrated.
Audience: Analysts who use IR instrumentation routinely and lab managers and researchers who use IR spectroscopy as an analytical tool.
Presenter: Gavin Aston is an Infrared Product Specialist with over 9 years experience supporting customers with their IR application needs. Gavin has also conducted numerous customer training courses on IR spectroscopy.
Format: Windows Media Player
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