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Description: There is often a choice of sampling techniques which may be used to measure the NIR spectrum of a given sample. Here we discuss some of the advantages and disadvantages of the various options to help the user choose the most appropriate technique for the application.
Audience: Analysts who use NIR instrumentation routinely and lab managers and researchers who are developing methods for future implementation.
Presenter: Jerry Sellors is an FT-IR Application Specialist with 20 years experience in the development of IR and NIR instrumentation and data handling software. Jerry has presented many customer seminars in the areas of NIR, IR spectroscopies and imaging.
Format: Windows Media Player
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